|
|
EDA365欢迎您登录!
您需要 登录 才可以下载或查看,没有帐号?注册
x
本帖最后由 stupid 于 2010-6-30 14:56 编辑 - ]2 V% m. C+ V+ H C( d4 R# q
( N' h1 y8 N" eChip-Level Design
$ N1 g: t- D7 e6 V+ B
) ~! S {, c, Z, ?& t# |Creating C++ IP for High Performance Hardware Implementations of FFTs- ]9 Y( V' H; `1 i& R# ^7 ~% H
! U5 M) i- A, E( ]4 A
Strong Encryption and Correct Design Are Not Enough: Protecting Your Secure System from Side Channel Attacks
6 a& m' M) B0 X1 W7 y% e! t* E) d- x5 t9 O$ e9 y
Board and System Design
( a; O/ Q0 ]' i9 y. P" M8 Z; Z2 L
! T: ^7 z4 W9 s& |% u; B w3 wEffect of Conductor Profile on the Insertion Loss, Phase Constant, and Dispersion in Thin High Frequency Transmission Lines- g; L8 y7 Q# V) J& f! Q- N# j
; w8 ^- \* [" B0 {) V2 Q+ R
Introduction and Comparison of an Alternate Methodology for Measuring Loss Tangent of PCB Laminates
\# y6 T2 K; I* m0 q
# a0 Z- k# |, Y, ], H9 G9 W; S/ ~Interconnect Design
, p: O( n/ g4 ^- j) o6 I
0 U2 {" U; j* ?4 U1 _Frequency Dependent Material Properties: So What?. q9 R q! F" _- \" A, S
/ s9 u) ?( n5 cAdditional Trace Losses due to Glass-Weave Periodic Loading. m4 |% ?7 S2 d: i! K" z3 `
9 G3 V! x2 w5 k# ^' v* jHigh-Speed Design and Test Category
5 n( o" C/ U$ O& a
8 V* q9 D+ p) |, [2 t4 M8 oA New Method for Receiver Tolerance Testing Using Crest Factor Emulation
# [5 S* M& d" k/ y. M0 W( G7 u3 \% U/ h
Accuracy Improvements of PDN Impedance Measurements in the Low to Middle Frequency Range# B0 A9 ], j% e8 m! [" |9 t
6 h& m: m8 d: w" ^% ~& Z( R5 MPower and RF Design Category
; l/ {& G0 |: O# {$ f
8 k9 D8 Q% ~* N& T$ p. k9 A6 _# SOn-Chip PDN Noise Characterization and Modeling
' y8 M0 F& w c3 |2 W1 l" L' N, m* R# X- `. s5 W8 J
Fast Physics-Based Via and Trace Models for Signal and Power Integrity Co-Analysis |
|