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混合信号测量
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3 J- c& K' S( p! z内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路0 L5 ^0 }4 g6 m3 W% W
- R* M2 O3 d/ u% r; A5 O. j, l0 R„ I. What is Mixed Signal
/ P% D3 R, o0 s& {„ II. Mixed Signal Test Parameters
* Q' _6 F! h6 m( F* _* s„ III. Signal Generation" k1 a- P" S, x7 p
„ IV. Signal Capture3 Z7 E) T: @8 e2 P/ C/ ]. h
„ V. Fast Fourier Transform
2 s B5 w4 L4 l; E„ VI. Testing Digital-to-Analog Converters% y; Q& ^: Q0 b0 R. w
„ VII. Testing Analog-to-Digital Converters
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( K) t0 @2 c* P+ c# o8 [. g. n„ Music CD3 ~) O8 l( L' N+ M6 R; g: {
„ Analog information is processed in digital form
4 h/ _6 ^% d+ `/ t- {4 F„ Modem
9 w1 z7 F- A; Y6 e„ Digital information is processed in analog form5 h( W# v% v% O4 z7 a4 B# t( k3 U
„ Mixed Signal System9 I: r! U. J6 k+ D! k, \, {0 b% W6 W
„ Processes analog information in digital form; or
7 n# R- @% f0 O0 _% [! j; D„ Processes digital information in analog form; or
+ ^! E! |0 r; Z5 Q0 Z0 k, H„ Both
8 V, Y1 s& Y& {- E* b„ Mixed Signal Device+ Y0 o: ]$ Y% P0 o
„ Operates across digital and analog domains by representing
6 B, Z5 s x9 l7 d9 l. r- N3 Nor processing either analog or digital information in either
1 u# j8 `8 `/ i' danalog or digital form
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发表于 2019-11-26 15:06
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