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混合信号测量
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# e: B2 e5 d Z; U0 D内容并不限于混合信号系统测试,而是一般芯片或模块测试的全过程,只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法,间或涉及到测试电路
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I. What is Mixed Signal* ^9 M& a5 \8 j( q4 z
II. Mixed Signal Test Parameters
/ d3 B8 K3 R6 q! v' m% J- o III. Signal Generation# X: A0 N T# `0 i3 e9 Y4 Y! W
IV. Signal Capture
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VI. Testing Digital-to-Analog Converters
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Analog information is processed in digital form
' Y: p. [/ V- _! H6 \8 u. X$ X Modem
6 K4 {8 B% u i6 c9 s' w+ { Digital information is processed in analog form
* ^/ n3 L8 y. L2 l) r9 h- ?+ m Mixed Signal System
! m- R; q' y$ w5 E+ U6 `) Y Processes analog information in digital form; or
& f7 w& z: i8 W1 l$ @- V Processes digital information in analog form; or4 f& `' [" ^' {- _" A6 `- q1 H
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Mixed Signal Device! j6 L3 F8 n9 A; y6 `* h
Operates across digital and analog domains by representing
+ t' ?6 G. Y0 u$ w- C0 vor processing either analog or digital information in either
7 G: t3 Q& o1 T6 E! [' x/ m, G" hanalog or digital form
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