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混合信号测量2 W" d+ O# m& O1 _2 w0 I# Z0 b1 A% H9 M
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内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路0 y% u: B) q, s2 Z4 O5 t) p
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„ I. What is Mixed Signal
$ g' I* a' T( L* c" U„ II. Mixed Signal Test Parameters& @& t1 D" ~5 B3 O7 ~
„ III. Signal Generation
% Z, {, M0 S5 j" O1 [. i) l R' r; V„ IV. Signal Capture
& i/ b8 ]5 _- J5 t„ V. Fast Fourier Transform, b% E2 G5 N9 h; l
„ VI. Testing Digital-to-Analog Converters
$ g$ {* G# W$ |; B& M5 |: i„ VII. Testing Analog-to-Digital Converters, p' f* e; v" O- J+ N' D
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„ Music CD
" g+ B) |$ I8 j$ E8 F% E„ Analog information is processed in digital form* W: {* a+ L# M9 w f2 W
„ Modem+ G; Z. E3 [6 }2 ~
„ Digital information is processed in analog form
3 Y' e* e9 h' t3 G„ Mixed Signal System
! d5 t$ d' i6 |; d; ~„ Processes analog information in digital form; or
, P; `% F2 O$ m% |; T {# o„ Processes digital information in analog form; or
( }$ I6 z9 H+ g5 h$ T4 O) b„ Both1 Q; c0 B( w1 u
„ Mixed Signal Device1 ?2 _+ s$ t+ t' r% E8 b0 P
„ Operates across digital and analog domains by representing
: m. A4 e8 ~, w, e+ kor processing either analog or digital information in either
, z( f! x! X7 F$ Uanalog or digital form
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发表于 2019-11-26 15:06
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